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    Academic Journal
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    Academic Journal

    Source: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 74:1-10 2025

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    Conference

    Source: 2024 7th International Conference on Pattern Recognition and Artificial Intelligence (PRAI) Pattern Recognition and Artificial Intelligence (PRAI), 2024 7th International Conference on. :700-706 Aug, 2024

    Relation: 2024 7th International Conference on Pattern Recognition and Artificial Intelligence (PRAI)

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    Academic Journal

    Source: IEEE Embedded Systems Letters IEEE Embedded Syst. Lett. Embedded Systems Letters, IEEE. 16(3):243-246 Sep, 2024

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    Conference

    Source: 2023 19th IEEE International Colloquium on Signal Processing & Its Applications (CSPA) Signal Processing & Its Applications (CSPA), 2023 19th IEEE International Colloquium on. :283-286 Mar, 2023

    Relation: 2023 19th IEEE International Colloquium on Signal Processing & Its Applications (CSPA)

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    Conference

    Source: 2022 12th International Conference on Electrical and Computer Engineering (ICECE) Electrical and Computer Engineering (ICECE), 2022 12th International Conference on. :56-59 Dec, 2022

    Relation: 2022 12th International Conference on Electrical and Computer Engineering (ICECE)

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    Conference

    Source: 2022 IEEE International Conference of Electron Devices Society Kolkata Chapter (EDKCON) Electron Devices Society Kolkata Chapter (EDKCON), 2022 IEEE International Conference of. :102-106 Nov, 2022

    Relation: 2022 IEEE International Conference of Electron Devices Society Kolkata Chapter (EDKCON)

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    Conference

    Source: 2022 19th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE) Electrical Engineering, Computing Science and Automatic Control (CCE), 2022 19th International Conference on. :1-6 Nov, 2022

    Relation: 2022 19th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE)

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    Conference

    Source: 2022 IEEE Workshop on Metrology for Agriculture and Forestry (MetroAgriFor) Metrology for Agriculture and Forestry (MetroAgriFor), 2022 IEEE Workshop on. :344-349 Nov, 2022

    Relation: 2022 IEEE International Workshop on Metrology for Agriculture and Forestry (MetroAgriFor)