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1Academic Journal
Authors: Hou, X., Breier, J., Kovacevic, M.
Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 32(8):1559-1563 Aug, 2024
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2Report
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3Academic Journal
Authors: Breier, J., Hou, X., Ochoa, M., Solano, J.
Source: IEEE Transactions on Dependable and Secure Computing IEEE Trans. Dependable and Secure Comput. Dependable and Secure Computing, IEEE Transactions on. 20(3):1895-1908 Jun, 2023
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4Academic Journal
Authors: Baksi, A., Breier, J., Dasu, V.A., Hou, X., Kim, H., Seo, H.
Source: IEEE Access Access, IEEE. 11:54175-54187 2023
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5Academic Journal
Authors: Breier, J., Jap, D., Hou, X., Bhasin, S., Liu, Y.
Source: IEEE Transactions on Reliability IEEE Trans. Rel. Reliability, IEEE Transactions on. 71(4):1527-1539 Dec, 2022
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6Academic Journal
Authors: Breier, J., Hou, X.
Source: IEEE Access Access, IEEE. 10:113122-113130 2022
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7Academic Journal
Authors: Hou, X., Breier, J., Bhasin, S.
Source: IEEE Transactions on Information Forensics and Security IEEE Trans.Inform.Forensic Secur. Information Forensics and Security, IEEE Transactions on. 17:3677-3690 2022
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8Academic Journal
Authors: Breier, J., Hou, X., Liu, Y.
Source: IEEE Transactions on Dependable and Secure Computing IEEE Trans. Dependable and Secure Comput. Dependable and Secure Computing, IEEE Transactions on. 18(3):1065-1079 Jun, 2021
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9Academic Journal
Authors: Won, Y., Hou, X., Jap, D., Breier, J., Bhasin, S.
Source: IEEE Transactions on Information Forensics and Security IEEE Trans.Inform.Forensic Secur. Information Forensics and Security, IEEE Transactions on. 16:3215-3227 2021
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10Academic Journal
Authors: Breier, J., Khairallah, M., Hou, X., Liu, Y.
Source: IEEE Transactions on Circuits and Systems II: Express Briefs IEEE Trans. Circuits Syst. II Circuits and Systems II: Express Briefs, IEEE Transactions on. 67(12):3322-3326 Dec, 2020
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11Conference
Authors: Chef, S., Chua, C.T., Tay, J.Y., Siah, Y.W., Bhasin, S., Breier, J., Gan, C.L.
Source: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2018 IEEE International Symposium on the. :1-6 Jul, 2018
Relation: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
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12Academic Journal
Authors: Breier, J., Jap, D., Hou, X., Bhasin, S.
Source: IEEE Transactions on Information Forensics and Security IEEE Trans.Inform.Forensic Secur. Information Forensics and Security, IEEE Transactions on. 15:1072-1085 2020
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13Academic Journal
Authors: Patranabis, S., Datta, N., Jap, D., Breier, J., Bhasin, S., Mukhopadhyay, D.
Source: IEEE Transactions on Computers IEEE Trans. Comput. Computers, IEEE Transactions on. 68(10):1498-1510 Oct, 2019
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14Conference
Authors: Dilip Kumar, S.V., Patranabis, S., Breier, J., Mukhopadhyay, D., Bhasin, S., Chattopadhyay, A., Baksi, A.
Source: 2017 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC) FDTC Fault Diagnosis and Tolerance in Cryptography (FDTC), 2017 Workshop on. :33-40 Sep, 2017
Relation: 2017 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC)
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15Periodical
Authors: Chan, E. W., Shiller, A. M., Joung, D. J., Arrington, E. C., Valentine, D. L., Redmond, M. C., Breier, J. A., Socolofsky, S. A., Kessler, J. D.
Source: Journal of geophysical research.Oceans. 124(11):8392-8399
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16Periodical
Authors: Chan, E. W., Shiller, A. M., Joung, D. J., Arrington, E. C., Valentine, D. L., Redmond, M. C., Breier, J. A., Socolofsky, S. A., Kessler, J. D.
Source: Journal of geophysical research.Oceans. 124(12):8852-8868
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17Conference
Authors: Breier, J., Schindler, F.
Source: LECTURE NOTES IN COMPUTER SCIENCE. (8407):405-412
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18Periodical
Authors: Breier, J., Jap, D., Bhasin, S.
Source: JOURNAL OF CRYPTOGRAPHIC ENGINEERING. 7(4):311-320
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19Periodical
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20Conference
Authors: Breier, J., Hudec, L.
Source: LECTURE NOTES IN COMPUTER SCIENCE. (7804):285-294