Showing 1 - 20 results of 74 Refine Results
  1. 1
    Conference

    Source: 2012 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures (ICMTS), 2012 IEEE International Conference on. :229-232 Mar, 2012

    Relation: 2012 IEEE International Conference on Microelectronic Test Structures (ICMTS)

  2. 2
    Conference

    Source: 2010 International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2010 IEEE International Conference on. :226-230 Mar, 2010

    Relation: 2010 International Conference on Microelectronic Test Structures (ICMTS)

  3. 3
    Conference

    Source: Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. Microelectronic Test Structures Microelectronic Test Structures, 2005. ICMTS 2005. Proceedings of the 2005 International Conference on. :257-261 2005

    Relation: ICMTS 2005. Proceedings of the 2005 International Conference on Microelectronic Test Structures

  4. 4
    Conference

    Source: Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects, 2005. Signal Propagation on Interconnects Signal Propagation on Interconnects, 2005. Proceedings. 9th IEEE Workshop on. :139-142 2005

    Relation: Proceedings. 9th IEEE Workshop on Signal Propagation on Interconnects

  5. 5
    Academic Journal

    Source: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 19(1):67-77 Feb, 2006

    Linked Full Text
  6. 6
    Academic Journal

    Source: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 50(11):2236-2247 Nov, 2003

  7. 7
    Conference

    Source: 2009 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures, 2009. ICMTS 2009. IEEE International Conference on. :56-61 Mar, 2009

    Relation: 2009 IEEE International Conference on Microelectronic Test Structures (ICMTS)

  8. 8
    Conference

    Source: 2009 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures, 2009. ICMTS 2009. IEEE International Conference on. :196-200 Mar, 2009

    Relation: 2009 IEEE International Conference on Microelectronic Test Structures (ICMTS)

  9. 9
    Conference

    Source: Proceedings: 6th IEEE Workshop on Signal Propagation on Interconnects Signal Propagation on Interconnects, 6th IEEE Workshop on. Proceedings. :75-77 2002

    Relation: 6th IEEE Workshop on Signal Propagation on Interconnects

  10. 10
    Conference

    Source: Proceedings. 8th IEEE Workshop on Signal Propagation on Interconnects Signal propagation on interconnects Signal Propagation on Interconnects, 2004. Proceedings. 8th IEEE Workshop on. :165-166 2004

    Relation: Proceedings. 8th IEEE Workshop on Signal Propagation on Interconnects

  11. 11
    Academic Journal

    Source: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 27(2):134-150 May, 2014

    Linked Full Text
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