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    Academic Journal

    Source: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 2(3):50-59 Sep, 2002

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    Academic Journal

    Authors: Wei-Lung Mao1, wlmao@yuntech.edu.tw, Yu-Ying Chiu1, Chao-Ting Chu2, Bing-Hong Lin1, Jian-Jie Hung3

    Source: Intelligent Automation & Soft Computing; 2022, Vol. 32 Issue 2, p923-936, 14p

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