SmartSiC™ for Manufacturing of SiC Power Devices

Authors: Daval, N., Drouin, A., Biard, H., Viravaux, L., Radisson, D., Rouchier, S., Gaudin, G., Widiez, J., Allibert, F., Rolland, E., Vladimirova, K., Gelineau, G., Troutot, N., Navone, C., Berre, G., Bosch, D., Leow, Y.L, Duboust, A., Bethoux, J-M., Boulet, R., Chapelle, A., Cela, E., Lavaitte, G., Bouville-Lallart, A., Bhargava, S., Schwarzenbach, W., Maddalon, C., Radu, I., Odoul, S., Delprat, D., Bonnin, O., Maleville, C.

Source: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2022 6th IEEE. :85-87 Mar, 2022

Relation: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

Engineered SiC materials for power technologies

Authors: Schwarzenbach, W., Rouchier, S., Berre, G., Boulet, R., Ledoux, O., Cela, E., Drouin, A., Chapelle, A., Monnoye, S., Biard, H., Alassaad, K., Viravaux, L., Mohamed, N. Ben, Radisson, D., Picun, G., Lavaitte, G., Bouville-Lallart, A., Roi, J., Widiez, J., Abadie, K., Rolland, E., Fournel, F., Gelineau, G., Mazen, F., Moulin, A., Moulin, C., Delprat, D., Daval, N., Odoul, S., Sandri, P., Maleville, C.

Source: 2022 International Conference on IC Design and Technology (ICICDT) IC Design and Technology (ICICDT), 2022 International Conference on. :55-56 Sep, 2022

Relation: 2022 International Conference on IC Design and Technology (ICICDT)

Tailored Polycrystalline Substrate for SmartSiC™ Substrates Enabling High Performance Power Devices

Authors: Biard, H., Odoul, S., Schwarzenbach, W., Radu, I., Maleville, C., Potier, A., Ferrato, M., Guajioty, E.

Source: Diffusion and defect data.Pt. B, Solid state phenomena. 344:47-52

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCRN632965575&indx=1&recIds=ETOCRN632965575

Microwave-assisted reversal of a single electron spin.

Authors: Godfrin, C.¹, Lumetti, S.^2,3, Biard, H.¹, Bonet, E.¹, Klyatskaya, S.⁴, Ruben, M.^4,5, Candini, A.^2,6, Affronte, M.^2,3, Wernsdorfer, W.^1,4,7, Balestro, F.^1,8

Source: Journal of Applied Physics; 2019, Vol. 125 Issue 14, pN.PAG-N.PAG, 8p, 1 Diagram, 3 Graphs