Simulation methodology for timing analysis and design optimization in digital superconducting electronics

Authors: Lo, Sam C., Barker, Aaron J., Whiteley, Stephen R., Mlinar, Eric, Chen, Jiajun, Wu, Dehuang, Singhal, Kishore

Source: 2022 23rd International Symposium on Quality Electronic Design (ISQED) Quality Electronic Design (ISQED), 2022 23rd International Symposium on. :33-38 Apr, 2022

Relation: 2022 23rd International Symposium on Quality Electronic Design (ISQED)

Variation Aware Optimization vs Classical Margin Optimization of Superconducting Electronics

Authors: Barker, Aaron J., Mlinar, Eric, Lo, Sam C., Singhal, Kishore

Source: IEEE transactions on applied superconductivity. 33(5):1-4

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCvdc_100177912023.0x000001&indx=1&recIds=ETOCvdc_100177912023.0x000001

High sigma statistical hold time analysis in FinFET sequential circuits

Authors: Lo, Sam C., Lee, Taylor T., Barker, Aaron J.

Source: 2017 18th International Symposium on Quality Electronic Design (ISQED) Quality Electronic Design (ISQED), 2017 18th International Symposium on. :215-220 Mar, 2017

Relation: 2017 18th International Symposium on Quality Electronic Design (ISQED)

Physics-based MOSFET model for variational modeling

PHYSICS-BASED MOSFET MODEL FOR VARIATIONAL MODELING

Multidimensional process corner derivation using surrogate based simultaneous yield analysis

Multidimensional Process Corner Derivation Using Surrogate Based Simultaneous Yield Analysis

Technician-Technologist Teamwork: Multifunctional Collaboration on Industry Projects.

Authors: Sundheim, Nancy K.¹, Barker, Aaron J.²

Source: Proceedings of the ASEE Annual Conference & Exposition. 2019, p19949-19963. 15p.