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1Academic Journal
Authors: Liang Chen, Pin Yang, Jie Xu, Baozhong Mu, Wenjie Li, Xinye Xu, Mingtao Li, Jinbo Li, Xin Wang, Xing Zhang, Feng Wang, Zhanshan Wang, Dong Yang
Source: Scientific Reports, Vol 14, Iss 1, Pp 1-10 (2024)
Subject Terms: X-ray imaging, Rayleigh–Taylor instability, High-resolution, AKB microscope, Medicine, Science
File Description: electronic resource
Relation: https://doaj.org/toc/2045-2322
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2Academic Journal
Authors: Yankang Wu, Pin Yang, Xing Zhang, Jianjun Dong, Jie Xu, Mingtao Li, Zhongjing Chen, Yingjie Li, Wei Jiang, Chuankui Sun, Liang Chen, Wenjie Li, Ji Yan, Yudong Pu, Yunsong Dong, Dong Yang, Feng Wang, Baozhong Mu, Zongqing Zhao
Source: AIP Advances, Vol 14, Iss 8, Pp 085312-085312-8 (2024)
File Description: electronic resource
Relation: https://doaj.org/toc/2158-3226
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3Academic Journal
Authors: Zhe Yang, Baozhong Mu, Mingxun Wang, Xin Wang, Jie Xu, Baolu Yang, Cheng Yang, Hong Li, Rongqi Lv
Source: IEEE Access, Vol 12, Pp 151046-151062 (2024)
Subject Terms: RGB-D, semantic segmentation, multimodal interaction, real-time, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
File Description: electronic resource
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4Academic Journal
Authors: Kuan Ren, Junfeng Wu, Jianjun Dong, Yaran Li, Tianxuan Huang, Hang Zhao, Yaoyuan Liu, Zhurong Cao, Jiyan Zhang, Baozhong Mu, Ji Yan, Wei Jiang, Yudong Pu, Yulong Li, Xiaoshi Peng, Tao Xu, Jiamin Yang, Ke Lan, Yongkun Ding, Shaoen Jiang, Feng Wang
Source: Scientific Reports, Vol 11, Iss 1, Pp 1-10 (2021)
File Description: electronic resource
Relation: https://doaj.org/toc/2045-2322
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5Academic Journal
Authors: Kuan Ren, Li Yao, Shenye Liu, Rongqing Yi, Baozhong Mu, Jingtao Zhu, Jie Xu, Wenjie Li, Wanli Shang, Jianjun Dong, Zhiwen Yang, Xing Zhang, Zhurong Cao, Yulong Li, Tao Xu, Zhanyang Guan, Huiyue Wei, Jiamin Yang, Yongkun Ding, Baohan Zhang, Shaoen Jiang, Feng Wang
Source: AIP Advances, Vol 12, Iss 7, Pp 075007-075007-6 (2022)
File Description: electronic resource
Relation: https://doaj.org/toc/2158-3226
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6Academic Journal
Authors: Mingxun Wang, Baolu Yang, Xin Wang, Cheng Yang, Jie Xu, Baozhong Mu, Kai Xiong, Yanyi Li
Source: Applied Sciences, Vol 12, Iss 22, p 11848 (2022)
Subject Terms: X-ray, object detection, occlusion, YOLO, transformer, deep learning, Technology, Engineering (General). Civil engineering (General), TA1-2040, Biology (General), QH301-705.5, Physics, QC1-999, Chemistry, QD1-999
File Description: electronic resource
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7Academic Journal
Authors: Yifan Chen, Xin Wang, Qinghua Song, Baolu Yang, Jie Xu, Kai Xiong, Baozhong Mu
Source: AIP Advances, Vol 9, Iss 12, Pp 125112-125112-7 (2019)
File Description: electronic resource
Relation: https://doaj.org/toc/2158-3226
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8Academic Journal
Authors: Yifan Chen, Xin Wang, Qinghua Song, Jie Xu, Baozhong Mu
Source: AIP Advances, Vol 8, Iss 10, Pp 105113-105113-9 (2018)
File Description: electronic resource
Relation: https://doaj.org/toc/2158-3226
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9Conference
Authors: Shengling Huang, Xin Wang, Yifan Chen, Baozhong Mu
Source: Proceedings of SPIE; 8/18/2018, Vol. 10802, p1-8, 8p
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10Conference
Authors: Yifan Chen, Xin Wang, Qinghua Song, Baozhong Mu
Source: Proceedings of SPIE; 8/18/2018, Vol. 10802, p1-6, 6p
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11Academic Journal
Authors: Shengzhen Yi1,2, Zhe Zhang1,2, Qiushi Huang1,2, Zhong Zhang1,2, Baozhong Mu1,2, Zhanshan Wang1,2, wangzs@tongji.edu.cn, Zhiheng Fang3, Wei Wang3, Sizu Fu3
Source: Review of Scientific Instruments; Oct2016, Vol. 87 Issue 10, p103501-1-103501-6, 6p, 5 Diagrams, 2 Charts, 3 Graphs
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12Academic Journal
Authors: Jie Xu1,2, Xin Wang1,2, wangx@tongji.edu.cn, Qi Zhan1,2, Shengling Huang1,2, Yifan Chen1,2, Baozhong Mu1,2, mubz@tongji.edu.cn
Source: Review of Scientific Instruments; Jul2016, Vol. 87 Issue 7, p073103-1-073103-7, 7p, 5 Color Photographs, 2 Diagrams, 2 Charts, 2 Graphs
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13Academic Journal
Authors: Shengzhen Yi1,2,3, Baozhong Mu1,2, Xin Wang1,2, Zhong Zhang1,2, Jingtao Zhu1,2, Zhanshan Wang1,2 wangzs@tongji.edu, Pengfei He3, Zhurong Cao4, Jianjun Dong4, Shenye Liu4, Yongkun Ding4
Source: Optical Engineering. May2014, Vol. 53 Issue 5, p1-7. 7p.
Subject Terms: *X-ray microscopes, *LASER plasmas, *IMAGING systems, *OPTICAL resolution, *MIRRORS