Investigation of microstructure and deuterium retention in the reduced activation tungsten-steel brazed joint.

Authors: Gurova, J.¹, Violinarus@inbox.ru, Bachurina, D.¹, Kozlov, I.¹, Bachurin, V.², Efimov, V.¹, Krutikova, O.¹, Suchkov, A.¹, Bobyr, N.³, Spitsyn, A.^1,3, Simakin, S.², Gasparyan, Y.¹

Source: Journal of Materials Science; Oct2023, Vol. 58 Issue 37, p14879-14888, 10p, 2 Color Photographs, 1 Diagram, 1 Chart, 5 Graphs

Investigation of the Intercalation and Deintercalation of Lithium Ions in a Thin-Film Lithium-Ion Battery by Rutherford Backscattering Spectrometry.

Authors: Kurbatov, S. V., Melesov, N. S., Parshin, E. O., Rudy, A. S., Mironenko, A. A., Naumov, V. V., Skundin, A. M., Bachurin, V. I.

Source: Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques; Dec2024, Vol. 18 Issue 6, p1374-1381, 8p

Analysis of Crystalline Phases of Electroactive Forms of a Composite of Polyvinylidene Fluoride and Tetrafluoroethylene Copolymer with Nanographite.

Authors: Bachurin, V. I., Savinski, N. G., Khramov, A. P., Smirnova, M. A., Selyukov, R. V.

Source: Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques; Dec2024, Vol. 18 Issue 6, p1340-1348, 9p

Formation of Nanostructures on the Surface of Aluminum–Silicon Films By Bombardment with Low-Energy Argon Ions of Inductive RF-Discharge Plasma.

Authors: Bachurin, V. I., Amirov, I. I., Lobzov, K. N., Simakin, S. G., Smirnova, M. A.

Source: Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques; Dec2024, Vol. 18 Issue 6, p1313-1318, 6p

Analyzing Products of the Electrochemical Exfoliation of Graphite via Rutherford Backscattering Spectrometry and X-Ray Diffractometry

Authors: Savinsky, N. G., Melesov, N. S., Parshin, E. O., Vasiliev, S. V., Bachurin, V. I., Churilov, A. B.

Source: Bulletin of the Russian Academy of Sciences.Physics. 84(6):732-735

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Angular Dependences of Silicon Sputtering by Gallium Focused Ion Beam

Authors: Bachurin, V. I., Zhuravlev, I. V., Pukhov, D. E., Rudy, A. S., Simakin, S. G., Smirnova, M. A., Churilov, A. B.

Source: Journal of surface investigation. 14(4):784-790

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Wavelike Periodic Structures on the Silicon Surface Initiated by Irradiation with a Focused Gallium Ion Beam.

Authors: Bachurin, V. I., Smirnova, M. A., Lobzov, K. N., Lebedev, M. E., Mazaletsky, L. A., Pukhov, D. E., Churilov, A. B.

Source: Journal of Surface Investigation: X-Ray, Synchrotron & Neutron Techniques; Aug2024, Vol. 18 Issue 4, p822-833, 12p

Study of Multilayer Thin Film Structures by Rutherford Backscattering Spectrometry

Authors: Bachurin, V. I., Melesov, N. S., Parshin, E. O., Rudy, A. S., Churilov, A. B.

Source: Technical physics letters. 45(6):609-612

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Depth Profiling of Layered Si−O−Al Thin Films with Secondary Ion Mass Spectrometry and Rutherford Backscattering Spectrometry

Authors: Bachurin, V. I., Melesov, N. S., Mironenko, A. A., Parshin, E. O., Rudy, A. S., Simakin, S. G., Churilov, A. B.

Source: Journal of surface investigation. 13(2):300-305

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Electrolyte–Plasma Cathodic Exfoliation of Graphite.

Authors: Grushevskii, E. A., Savinskii, N. G., Bachurin, V. I.

Source: Bulletin of the Russian Academy of Sciences: Physics; Apr2024, Vol. 88 Issue 4, p485-490, 6p

Sputtering of Silicon and Silicon Dioxide by Low-Energy Ions of Dense Nitrogen and Argon Plasma

Authors: Bachurin, V. I., Izyumov, M. O., Amirov, I. I., Shuvaev, N. O.

Source: Bulletin of the Russian Academy of Sciences.Physics. 82(2):127-130

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The opportunities of Rutherford backscattering spectroscopy for analysis of multilayer nanometer thin film structures
International Conference on Micro- and Nano-Electronics 2018

Authors: Bachurin, V., Churilov, A., Melesov, N., Parshin, E., Rudy, A., Trushin, O.

Source: Proceedings of SPIE, the International Society for Optical Engineering. 11022:110221I-110221I-8

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Magnetic Fluid Layer on a Cylinder in a Traveling Magnetic Field
Bunsen:; Magnetic colloidal fluids: preparation characterization physical properties and applications

Authors: Zimmermann, K., Zeidis, I., Naletova, V. A., Turkov, V. A., Bachurin, V. E.

Source: ZIETSCHRIFT FUR PHYSIKALISCHE CHEMIE -FRANKFURT AM MAIN THEN WIESBADEN THEN MUNCHEN-, ISSN. 220(1):117-124

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Temperature Dependence of Secondary Ion Emission of Nickel
Ion surface interaction; ISI 2003

Authors: Bachurin, V. I., Minnebaev, K. F., Nasretdinov, A. A.

Source: BULLETIN- RUSSIAN ACADEMY OF SCIENCES PHYSICS C/C OF IZVESTIIA- ROSSIISKAIA AKADEMIIA NAUK SERIIA FIZICHESKAIA. 68(NO 3):441-444

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Impact of Topographical Inhomogeneities on a Wavy Microrelief of the Silicon Surface
Ion-surface interaction

Authors: Smirnov, V. K., Kibalov, D. S., Lepshin, P. A., Bachurin, V. I.

Source: BULLETIN- RUSSIAN ACADEMY OF SCIENCES PHYSICS C/C OF IZVESTIIA- ROSSIISKAIA AKADEMIIA. 64(NO 4):501-504

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Angular dependences of surface composition, sputtering and ripple formation on silicon under N~2^+ ion bombardment
Ion-surface interaction

Authors: Bachurin, V. I., Lepshin, P. A., Smirnov, V. K.

Source: VACUUM -LONDON THEN OXFORD- PERGAMON-. 56(NO 4):241-246

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Computer simulation of the two-stage ion polishing of a silicon surface

Authors: Birkgan, S. E., Bachurin, V. I.

Source: JOURNAL OF SURFACE INVESTIGATION X-RAY SYNCHROTRON AND NEUTRON TECHNIQUES C/C OF POVERKHNOST' RENTGENOVSKIE SINKHROTONNYE I NEITRONNYE ISSLEDOVANIIA. 8(3):524-529

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Mössbauer studies of magnetite nanoparticles

Authors: Shipilin, M. A., Zakharova, I. N., Shipilin, A. M., Bachurin, V. I.

Source: JOURNAL OF SURFACE INVESTIGATION X-RAY SYNCHROTRON AND NEUTRON TECHNIQUES C/C OF POVERKHNOST' RENTGENOVSKIE SINKHROTONNYE I NEITRONNYE ISSLEDOVANIIA. 8(3):557-561

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Influence of oxygen dose and heat treatment conditions on the formation of ion synthesized borosilicate layers

Authors: Zorina, D. D., Pron, N. P., Krivelevich, S. A., Bachurin, V. I., Churilov, A. B.

Source: BULLETIN- RUSSIAN ACADEMY OF SCIENCES C/C OF IZVESTIIA- ROSSIISKAIA AKADEMIIA NAUK SERIIA FIZICHESKAIA. 76(5):588-591

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Features of energy dependence of NiPd sputtering for various ion irradiation angles

Authors: Tolpin, K. A., Bachurin, V. I., Yurasova, V. E.

Source: NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION B. 273:76-79

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCRN305602551&indx=1&recIds=ETOCRN305602551