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1Academic Journal
Authors: Potorti, F., Torres-Sospedra, J., Quezada-Gaibor, D., Jimenez, A.R., Seco, F., Perez-Navarro, A., Ortiz, M., Zhu, N., Renaudin, V., Ichikari, R., Shimomura, R., Ohta, N., Nagae, S., Kurata, T., Wei, D., Ji, X., Zhang, W., Kram, S., Stahlke, M., Mutschler, C., Crivello, A., Barsocchi, P., Girolami, M., Palumbo, F., Chen, R., Wu, Y., Li, W., Yu, Y., Xu, S., Huang, L., Liu, T., Kuang, J., Niu, X., Yoshida, T., Nagata, Y., Fukushima, Y., Fukatani, N., Hayashida, N., Asai, Y., Urano, K., Ge, W., Lee, N., Fang, S., Jie, Y., Young, S., Chien, Y., Yu, C., Ma, C., Wu, B., Wang, Y., Fan, Y., Poslad, S., Selviah, D.R., Wang, W., Yuan, H., Yonamoto, Y., Yamaguchi, M., Kaichi, T., Zhou, B., Liu, X., Gu, Z., Yang, C., Wu, Z., Xie, D., Huang, C., Zheng, L., Peng, A., Jin, G., Wang, Q., Luo, H., Xiong, H., Bao, L., Zhang, P., Zhao, F., Hung, C., Antsfeld, L., Chidlovskii, B., Jiang, H., Xia, M., Yan, D., Li, Y., Dong, Y., Silva, I., Pendao, C., Meneses, F., Nicolau, M.J., Costa, A., Moreira, A., De Cock, C., Plets, D., Opiela, M., Dzama, J., Zhang, L., Li, H., Chen, B., Liu, Y., Yean, S., Lim, B.Z., Teo, W.J., Lee, B.S., Oh, H.L.
Source: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 22(6):5011-5054 Mar, 2022
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2Conference
Authors: Yamaguchi, T., Kawase, Y., Onogi, W., Ota, T., Asai, Y.
Source: 2020 23rd International Conference on Electrical Machines and Systems (ICEMS) Electrical Machines and Systems (ICEMS), 2020 23rd International Conference on. :1882-1887 Nov, 2020
Relation: 2020 23rd International Conference on Electrical Machines and Systems (ICEMS)
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3Conference
Authors: Parikh, P., Wu, Y-F., Shen, L., Gritters, J., Hosoda, T., Barr, R., Smith, K., Shono, K., McKay, J., Clement, H., Chowdhury, S., Yea, S., Smith, P., McCarthy, L., Birkhahn, R., Zuk, P., Asai, Y.
Source: 2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS) BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2018 IEEE. :239-242 Oct, 2018
Relation: 2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)
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4Academic Journal
Authors: Nishio, T., Okamoto, H., Nakashima, K., Koda, Y., Yamamoto, K., Morikura, M., Asai, Y., Miyatake, R.
Source: IEEE Journal on Selected Areas in Communications IEEE J. Select. Areas Commun. Selected Areas in Communications, IEEE Journal on. 37(11):2413-2427 Nov, 2019
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5Academic Journal
Authors: Hatakeyama, M., Asai, Y., Nakato, D., Nishimura, M., Hatano, Y., Sunada, S., Sato, K.
Source: In Nuclear Materials and Energy March 2024 38
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6Periodical
Authors: Yamamoto, T., Ando, K., Asai, Y., Muneyoshi, Y., Ida, S., Goto, H., Sato, Y., Tanaka, T.
Source: Iryō-yakugaku. 49(3):77-87
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7Conference
Authors: Chowdhury, S., Wu, Y., Shen, L., Smith, K., Smith, P., Kikkawa, T., Gritters, J., McCarthy, L., Lal, R., Barr, R., Wang, Z., Mishra, U., Parikh, P., Hosoda, T., Shono, K., Imanishi, K., Ogino, T., Mochizuki, A., Kiuchi, K., Asai, Y.
Source: 2016 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS) Compound Semiconductor Integrated Circuit Symposium (CSICS), 2016 IEEE. :1-4 Oct, 2016
Relation: 2016 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)
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8Periodical
Authors: Asai, Y., Takai, Y., Miyake, T., Morikawa, Y., Murasaka, T., Nakagawa, Y., Kanayama, T., Abe, Y., Masuda, N., Takamura, Y.
Source: Iryō-yakugaku. 48(9):368-378
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9Periodical
Authors: Takeuchi, T., Hayashi, N., Asai, Y., Kayaoka, Y., Yoshida, K.
Source: Physical and engineering sciences in medicine. 45(2):487-496
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10Conference
Authors: Asai, Y., Hirata, K., Ota, T.
Source: International Symposium on Power Electronics Power Electronics, Electrical Drives, Automation and Motion Power Electronics, Electrical Drives, Automation and Motion (SPEEDAM), 2012 International Symposium on. :1547-1551 Jun, 2012
Relation: 2012 International Symposium on Power Electronics, Electrical Drives, Automation and Motion (SPEEDAM 2012)
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11Academic Journal
Authors: Asai Y, Tsutsui S, Yoshimura N, Hashizume H, Iidaka T, Horii C, Kawaguchi H, Nakamura K, Tanaka S, Yoshida M, Yamada H
Source: Journal of Pain Research, Vol Volume 15, Pp 33-38 (2022)
Subject Terms: adult spinal deformity, spinopelvic sagittal alignment, low back pain, population-based cohort, Medicine (General), R5-920
File Description: electronic resource
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12Conference
Authors: Parikh, P., Wu, Y., Shen, L., Barr, R., Chowdhury, S., Gritters, J., Yea, S., Smith, P., McCarthy, L., Birkhahn, R., Moore, M., McKay, J., Clement, H., Mishra, U., Lal, R., Zuk, P., Hosoda, T., Shono, K., Imanishi, K., Asai, Y.
Source: 2018 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2018 IEEE International. :19.7.1-19.7.4 Dec, 2018
Relation: 2018 IEEE International Electron Devices Meeting (IEDM)
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13Academic Journal
Authors: Okuyama, T., Okita, M., Abe, T., Asai, Y., Kitano, H., Nomura, T., Hagihara, K.
Source: IEEE Transactions on Parallel and Distributed Systems IEEE Trans. Parallel Distrib. Syst. Parallel and Distributed Systems, IEEE Transactions on. 25(8):1966-1975 Aug, 2014
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14Conference
Authors: Wenjie Jiang, Asai, Y., Onizawa, T., Aikawa, S.
Source: 2006 IEEE 63rd Vehicular Technology Conference Vehicular Technology Conference, 2006. VTC 2006-Spring. IEEE 63rd. 5:2423-2428 2006
Relation: 2006 IEEE 63rd Vehicular Technology Conference
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15Conference
Authors: Onizawa, T., Ohta, A., Asai, Y., Aikawa, S.
Source: 2006 IEEE 63rd Vehicular Technology Conference Vehicular Technology Conference, 2006. VTC 2006-Spring. IEEE 63rd. 4:1782-1786 2006
Relation: 2006 IEEE 63rd Vehicular Technology Conference
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16Conference
Authors: Noguchi, T., Nishiyama, K., Asai, Y., Matsubara, T.
Source: 2005 International Conference on Power Electronics and Drives Systems Wireless Pervasive Computing Power Electronics and Drives Systems, 2005. PEDS 2005. International Conference on. 2:1474-1479 2005
Relation: International Symposium on Wireless Pervasive Computing 2006
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17Conference
Source: 2005 International Conference on Natural Language Processing and Knowledge Engineering Natural Language Processing and Knowledge Engineering Natural Language Processing and Knowledge Engineering, 2005. IEEE NLP-KE '05. Proceedings of 2005 IEEE International Conference on. :410-415 2005
Relation: Proceedings of the 2005 12th IEEE International Conference on Natural Language Processing and Knowledge Engineering (IEEE NLP-KE '05)
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18Conference
Authors: Onizawa, T., Fujita, T., Asai, Y., Uchida, D., Ohta, A., Aikawa, S.
Source: VTC-2005-Fall. 2005 IEEE 62nd Vehicular Technology Conference, 2005. Vehicular Technology Conference, 2005. VTC-2005-Fall. 2005 IEEE 62nd. 2:1021-1025 2005
Relation: VTC 2005 Fall - 2005 IEEE 62nd Vehicular Technology Conference
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19Conference
Authors: Uchida, D., Fujita, T., Kagami, O., Umehira, M., Ohta, A., Asai, Y.
Source: VTC-2005-Fall. 2005 IEEE 62nd Vehicular Technology Conference, 2005. Vehicular Technology Conference, 2005. VTC-2005-Fall. 2005 IEEE 62nd. 1:578-582 2005
Relation: VTC 2005 Fall - 2005 IEEE 62nd Vehicular Technology Conference
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20Report
Authors: Zhong, X., Rungger, I., Zapol, P., Nakamura, H., Asai, Y., Heinonen, O.
Subject Terms: Condensed Matter - Mesoscale and Nanoscale Physics, Condensed Matter - Materials Science
Access URL: http://arxiv.org/abs/1602.06793