Digital Low Drop-out Regulator Based on Event-driven Operating Modes

Authors: Pourmoslemi, Ashkan, Anstotz, Freddy, Frick, Vincent

Source: 2024 31st IEEE International Conference on Electronics, Circuits and Systems (ICECS) Electronics, Circuits and Systems (ICECS), 2024 31st IEEE International Conference on. :1-4 Nov, 2024

Relation: 2024 31st IEEE International Conference on Electronics, Circuits and Systems (ICECS)

Real time surface morphology analysis of semiconductor materials and devices using 4D interference microscopy.

Authors: Montgomery, Paul, Anstotz, Freddy, Johnson, Gyasi

Source: Journal of Materials Science: Materials in Electronics; Oct2008 Supplement 1, Vol. 19, pS194-S198, 5p

Far field optical nanoscopy: How far can you go in nanometric characterization without resolving all the details?

Authors: Montgomery, Paul C., Serio, Bruno, Anstotz, Freddy, Montaner, Denis

Source: In Applied Surface Science 15 September 2013 281:89-95

Characterization of Functional Materials Using Coherence Scanning Interferometry and Environmental Chambers.

Authors: Montgomery, Paul C., Flury, Manuel, Anstotz, Freddy, Marbach, Sébastien, Cordier, Christophe, Bartringer, Jérémy, Mukhtar, Husneni, Leong-Hoï, Audrey, Rubin, Anne, Shpiruk, Anastasiia, Del Nero, Mireille, Barillon, Rémi

Source: ACS Omega; 3/28/2023, Vol. 8 Issue 12, p10643-10655, 13p

Immersion white light scanning interferometry using elastic polymer path length compensation.

Authors: Mukhtar, Husneni, Montgomery, Paul, Anstotz, Freddy, Barillon, Rémi, Rubin, Anne

Source: Proceedings of SPIE; 4/16/2018, Vol. 10678, p1-9, 9p

Development of a 3D dynamic measurement system using a high speed camera with white light scanning interference microscopy associated with real-time FPGA image processing.

Authors: Johnson, Gyasi, Montgomery, Paul, Anstotz, Freddy, Kiefer, Renaud

Source: Proceedings of SPIE; Nov2007, Issue 1, p661633-661633-9, 9p

Overview of label-free far field optical nanoscopy techniques for nanometrology

Authors: Gorecki, Christophe, Asundi, Anand K., Osten, Wolfgang, Montgomery, Paul, Leong-Hoï, Audrey, Anstotz, Freddy, Liu, Hui, Simon, Bertrand, Debailleul, Matthieu, Haeberlé, Olivier

Source: Proceedings of SPIE; April 2016, Vol. 9890 Issue: 1 p98900G-98900G-11, 9791112p

Design and preliminary results of APVD: a fast low-noise low-power rad-hard CMOS mixed circuit for the CMS silicon tracker at LHC.

Authors: Gardien, S., Pangaud, P., Walder, J.-P., Goerlach, U., Hoffmann, C., Hu, C., Lounis, A., Maazouzi, C., Schmitt, P., Hall, G., Raymond, M., Anstotz, Freddy, Berst, J.-D., Deptuch, G., Hu, Y., Sohler, J.-L., Turchetta, Renato A. D., Borgeaud, Pierre, Lachartre, D., French, Marcus J.

Source: Proceedings of SPIE; Nov1998 Part 2, Issue 1, p329-338, 10p

FILTRES128: front-end readout electronic development for silicon microstrip detectors.

Authors: Anstotz, Freddy, Hu, Y., Michel, J., Sohler, J.-L., Lachartre, D.

Source: Proceedings of SPIE; Nov1998 Part 2, Issue 1, p339-346, 8p

Immersion white light scanning interferometry using elastic polymer path length compensation

Authors: Gorecki, Christophe, Asundi, Anand K., Osten, Wolfgang, Mukhtar, Husneni, Montgomery, Paul, Anstotz, Freddy, Barillon, Rémi, Rubin, Anne

Source: Proceedings of SPIE; May 2018, Vol. 10678 Issue: 1 p1067816-1067816-9