Showing 1 - 18 results of 18 Refine Results
  1. 1
    Academic Journal

    Source: IEEE Transactions on Circuits and Systems II: Express Briefs IEEE Trans. Circuits Syst. II Circuits and Systems II: Express Briefs, IEEE Transactions on. 70(3):1149-1153 Mar, 2023

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  2. 2
    Academic Journal

    Source: IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 26(8):1609-1612 Aug, 2018

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  3. 3
    Conference

    Source: 2014 IEEE International Conference on Bioinformatics and Bioengineering Bioinformatics and Bioengineering (BIBE), 2014 IEEE International Conference on. :231-237 Nov, 2014

    Relation: 2014 IEEE International Conference on Bioinformatics and Bioengineering (BIBE)

  4. 4
    Conference

    Source: Eleventh IEEE European Test Symposium (ETS'06) European Test Symposium Test Symposium, 2006. ETS '06. Eleventh IEEE European. :213-218 2006

    Relation: Eleventh IEEE European Test Symposium

  5. 5
    Conference

    Source: Proceedings. SBCCI 2004. 17th Symposium on Integrated Circuits and Systems Design (IEEE Cat. No.04TH8784) Integrated circuits and systems design Integrated Circuits and Systems Design, 2004. SBCCI 2004. 17th Symposium on. :111-116 2004

    Relation: Proceedings. SBCCI 2004. 17th Symposium on Integrated Circuits and Systems Design

  6. 6
    Conference

    Source: Seventh IEEE International High-Level Design Validation and Test Workshop, 2002. High-level design validation and test workshop High-Level Design Validation and Test Workshop, 2002. Seventh IEEE International. :133-138 2002

    Relation: IEEE International High Level Design Validation and Test Workshop (HLDVT'02)

  7. 7
    Conference

    Source: Design, Automation and Test in Europe Design, Automation and Test in Europe, 2005. Proceedings. :62-63 Vol. 1 2005

    Relation: Proceedings. Design, Automation and Test in Europe

  8. 8
    Conference

    Source: IEEE International Conference on Test, 2005. International Test Conference Test Conference, 2005. Proceedings. ITC 2005. IEEE International. :9 pp.-599 2005

    Relation: 2005 IEEE International Test Conference

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  13. 13
    Academic Journal

    Source: Proceedings of the Annual Congresses of the Grassland Society of Southern Africa; Jan1982, Vol. 17 Issue 1, p106-111, 6p

  14. 14
    Academic Journal

    Source: Proceedings of the Annual Congresses of the Grassland Society of Southern Africa; Jan1981, Vol. 16 Issue 1, p145-149, 5p

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