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1
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2Conference
Source: 2023 16th International Conference Management of large-scale system development (MLSD) Management of large-scale system development (MLSD), 2023 16th International Conference. :1-4 Sep, 2023
Relation: 2023 16th International Conference Management of large-scale system development (MLSD)
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3Conference
Authors: Turovsky, Ya. A., Alekseev, V. Yu., Borzunov, S. V.
Source: 2023 25th International Conference on Digital Signal Processing and its Applications (DSPA) Digital Signal Processing and its Applications (DSPA), 2023 25th International Conference on. :1-4 Mar, 2023
Relation: 2023 25th International Conference on Digital Signal Processing and its Applications (DSPA)
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4Academic Journal
Authors: Gerasymov, I., Witkiewicz-Lukaszek, S., Zorenko, T., Bartosiewicz, K., Zorenko, Y., Winiecki, J., Kofanov, D., Boyaryntseva, Y., Tkachenko, S., Arhipov, P., Galenin, E., Kurtsev, D., Zelenskaya, O., Alekseev, V., Lebbou, K., Sidletskiy, O.
Source: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 70(7):1362-1369 Jul, 2023
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5Report
Authors: Sibilieva, T., Alekseev, V., Barsuk, S., Berns, S., Boillat, E., Boiaryntseva, I., Boyarintsev, A., Carbone, A., De Roeck, A., Dolan, S., Driuk, T., Gendotti, A., Gerasymov, I., Grynyov, B., Hugon, S., Kose, U., Opolonin, O., Rubbia, A., Sgalaberna, D., Sibilyev, N., Tretyak, S., Weber, T., Wuthrich, J., Zhao, X. Y.
Subject Terms: Physics - Instrumentation and Detectors
Access URL: http://arxiv.org/abs/2212.13394
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6Academic Journal
Authors: Alekseev, V.
Source: In Partial Differential Equations in Applied Mathematics December 2024 12
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7Conference
Authors: Anishchenko, L. N., Zhuravlev, A. V., Razevig, V. V., Chizh, M. A., Alekseev, V. A., Skrebkov, A. V.
Source: 2019 PhotonIcs & Electromagnetics Research Symposium - Spring (PIERS-Spring) PhotonIcs & Electromagnetics Research Symposium - Spring (PIERS-Spring), 2019. :3229-3234 Jun, 2019
Relation: 2019 PhotonIcs & Electromagnetics Research Symposium - Spring (PIERS-Spring)
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8Conference
On-board Information-Measurement System for Railway Track Condition Assessment. Metrological Support
Authors: Alekseev, V. V., Boronakhin, A. M., Korolev, P. G., Orlova, N. V.
Source: 2019 XXII International Conference on Soft Computing and Measurements (SCM)) Soft Computing and Measurements (SCM), 2019 XXII International Conference on. :17-20 May, 2019
Relation: 2019 XXII International Conference on Soft Computing and Measurements (SCM)
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9Report
Authors: Alekseev, V. I., Baskov, V. A., Dronov, V. A., Lvov, A. I., Koltsov, A. V., Krechetov, Yu. F., Polyansky, V. V., Sidorin, S. S.
Access URL: http://arxiv.org/abs/2005.08851
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10Report
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11Report
Authors: Alekseev, V. I., Baskov, V. A., Dronov, V. A., L'vov, A. I., Koltsov, A. V., Krechetov, Yu. F., Polyansky, V. V.
Access URL: http://arxiv.org/abs/2004.00937
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12Conference
Authors: Alekseev, V. V., Konovalova, V. S., Sedunova, E. N.
Source: 2017 XX IEEE International Conference on Soft Computing and Measurements (SCM) Soft Computing and Measurements (SCM), 2017 XX IEEE International Conference on. :554-557 May, 2017
Relation: 2017 XX IEEE International Conference on Soft Computing and Measurements (SCM)
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13Periodical
Authors: Gerasymov, I., Witkiewicz-Lukaszek, S., Zorenko, T., Bartosiewicz, K., Zorenko, Yu, Winiecki, J., Kofanov, D., Boyaryntseva, Ya, Tkachenko, S., Arhipov, P., Galenin, E., Kurtsev, D., Zelenskaya, O., Alekseev, V., Lebbou, K., Sidletskiy, O.
Source: IEEE transactions on nuclear science. 70(7):1362-1369
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14Academic Journal
Authors: Skrypnyk, T., Viahin, O., Bespalova, I., Zelenskaya, O., Tarasov, V., Alekseev, V., Yefimova, S., Sorokin, O.
Source: In Radiation Measurements December 2023 169
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15Report
Authors: Alekseev, V. I., Baskov, V. A., Dronov, V. A., Lvov, A. I., Koltsov, A. V., Krechetov, Yu. F., Polyansky, V. V., Sidorin, S. S.
Access URL: http://arxiv.org/abs/1912.08095
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16Report
Authors: Alekseev, V. I., Baskov, V. A., Dronov, V. A., L'vov, A. I., Koltsov, A. V., Krechetov, Yu. F., Malinovsky, E. I., Polyansky, V. V.
Subject Terms: Physics - Instrumentation and Detectors
Access URL: http://arxiv.org/abs/1911.12608
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17Conference
Authors: Alekseev, V. V., Orlova, N. V., Sedunova, E. N.
Source: 2017 XX IEEE International Conference on Soft Computing and Measurements (SCM) Soft Computing and Measurements (SCM), 2017 XX IEEE International Conference on. :583-585 May, 2017
Relation: 2017 XX IEEE International Conference on Soft Computing and Measurements (SCM)
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18Conference
Authors: Shabanov, V. A., Alekseev, V. Y., Yusupov, R. Z.
Source: 2016 2nd International Conference on Industrial Engineering, Applications and Manufacturing (ICIEAM) Industrial Engineering, Applications and Manufacturing (ICIEAM), International Conference on. :1-5 2016
Relation: 2016 2nd International Conference on Industrial Engineering, Applications and Manufacturing (ICIEAM)
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19Academic Journal
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20Academic Journal
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