Disorder and cavity evolution in single-crystalline Ge during implantation of Sb ions monitored in-situ by spectroscopic ellipsometry

Authors: Lohner, Tivadar, Nemeth, Attila, Zolnai, Zsolt, Kalas, Benjamin, Romanenko, Alekszej, Khanh, Nguyen Quoc, Szilagyi, Edit, Kotai, Endre, Agocs, Emil, Toth, Zsolt, Budai, Judit, Petrik, Peter, Fried, Miklos, Barsony, Istvan, Gyulai, Jozsef

Source: Materials Science in Semiconductor Processing 152 (2022) 107062

Subject Terms: Condensed Matter - Materials Science, Physics - Computational Physics

Access URL: http://arxiv.org/abs/2305.07635

Polarization modulated spectroscopic ellipsometry-based surface plasmon resonance biosensor for E. coli K12 detection.

Authors: Zangenehzadeh, Soraya^1,2 (AUTHOR), Agocs, Emil^1,2 (AUTHOR), Schröder, Fenja¹ (AUTHOR), Amroun, Nassima¹ (AUTHOR), Biedendieck, Rebekka³ (AUTHOR), Jahn, Dieter³ (AUTHOR), Günther, Axel^1,2 (AUTHOR), Zheng, Lei^2,4 (AUTHOR), Roth, Bernhard^2,4 (AUTHOR), Johannes, Hans-Hermann^1,2 (AUTHOR) h-h.johannes@tu-braunschweig.de, Kowalsky, Wolfgang^1,2 (AUTHOR)

Source: Scientific Reports. 11/7/2024, Vol. 14 Issue 1, p1-11. 11p.

Subject Terms: *SURFACE plasmon resonance, *ESCHERICHIA coli, *BORATE crystals, *DETECTION of microorganisms, *DRUG target, *ESCHERICHIA coli O157:H7

Bacteria detection in a Kretschmann geometry flow cell at a plasmon-enhanced interface with spectroscopic ellipsometer

Authors: Zangenehzadeh, Soraya, Agócs, Emil, Jivani, Harsh, Könemund, Lea, Neumann, Laurie, Hirschberg, Felix, Herdan, Svenja, Biedendieck, Rebekka, Jahn, Dieter, Roth, Bernhard W., Johannes, Hans-Hermann, Kowalsky, Wolfgang

Source: In Thin Solid Films 1 January 2023 764

Composite polymeric-inorganic waveguide fabricated by injection molding for biosensing applications

Authors: Dortu, Fabian, Bernier, Damien, Cestier, Isabelle, Vandormael, Denis, Emmerechts, Carl, Fissi, Lamia E, Francis, Laurent, Nittler, Laurent, Houssiau, Laurent, Fodor, Balint, Agocs, Emil, Petrik, Peter, Fried, Miklos

Source: 2014 16th International Conference on Transparent Optical Networks (ICTON) Transparent Optical Networks (ICTON), 2014 16th International Conference on. :1-4 Jul, 2014

Relation: 2014 16th International Conference on Transparent Optical Networks (ICTON)

Concordant element of the oxidation kinetics—Interpretation of ellipsometric measurements on Zr

Authors: Romanenko, Alekszej, Agócs, Emil, Hózer, Zoltán, Petrik, Peter, Serényi, Miklós

Source: In Applied Surface Science 30 January 2022 573

Ultrafast laser plasma assisted rare-earth doping for silicon photonics

Authors: Jose, Gin, Chandrappan, Jayakrishnan, Kamil, Suraya Ahmad, Murray, Matthew, Zolnai, Zsolt, Agocs, Emil, Petrik, Peter, Steenson, Paul, Krauss, Thomas

Source: 2016 Conference on Lasers and Electro-Optics (CLEO) Lasers and Electro-Optics (CLEO), 2016 Conference on. :1-2 Jun, 2016

Relation: 2016 Conference on Lasers and Electro-Optics (CLEO)

Platform manufacturing technique for next generation integrated photonic components

Authors: Murray, Matthew, Chandrappan, Jayakrishnan, Kamil, Suraya Ahmad, Kakkar, Tarun, Petrik, Peter, Agocs, Emil, Zolnai, Zsolt, Hogg, Richard, Childs, David, Krauss, Thomas, White, Ian, Penty, Richard, Steenson, Paul, Jha, Animesh, Jose, Gin

Source: 2015 17th International Conference on Transparent Optical Networks (ICTON) Transparent Optical Networks (ICTON), 2015 17th International Conference on. :1-2 Jul, 2015

Relation: 2015 17th International Conference on Transparent Optical Networks (ICTON)

Spectroscopic ellipsometry of columnar porous Si thin films and Si nanowires

Authors: Fodor, Bálint, Defforge, Thomas, Agócs, Emil, Fried, Miklós, Gautier, Gaël, Petrik, Péter

Source: In Applied Surface Science 1 November 2017 421 Part B:397-404

Grating coupled optical waveguide interferometry combined with in situ spectroscopic ellipsometry to monitor surface processes in aqueous solutions

Authors: Agocs, Emil, Kozma, Peter, Nador, Judit, Hamori, Andras, Janosov, Milan, Kalas, Benjamin, Kurunczi, Sandor, Fodor, Balint, Ehrentreich-Förster, Eva, Fried, Miklos, Horvath, Robert, Petrik, Peter

Source: In Applied Surface Science 1 November 2017 421 Part B:289-294

Enhancing optical microscopy illumination to enable quantitative imaging

Authors: Agocs, Emil, Attota, Ravi

Source: Scientific reports. 8(1):1-9

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCvdc_100128013932.0x000001&indx=1&recIds=ETOCvdc_100128013932.0x000001

Porosity and thickness characterization of porous Si and oxidized porous Si layers – An ultraviolet–visible–mid infrared ellipsometry study

Authors: Fodor, Balint, Agocs, Emil, Bardet, Benjamin, Defforge, Thomas, Cayrel, Frederic, Alquier, Daniel, Fried, Miklos, Gautier, Gael, Petrik, Peter

Source: In Microporous and Mesoporous Materials June 2016 227:112-120

Bilayered (silica–chitosan) coatings for studying dye release in aqueous media: The role of chitosan properties

Authors: Dabóczi, Mátyás, Albert, Emőke, Agócs, Emil, Kabai-Faix, Márta, Hórvölgyi, Zoltán

Source: In Carbohydrate Polymers 20 January 2016 136:137-145

Investigation of thin polymer layers for biosensor applications

Authors: Saftics, András, Agócs, Emil, Fodor, Bálint, Patkó, Dániel, Petrik, Péter, Kolari, Kai, Aalto, Timo, Fürjes, Péter, Horvath, Robert, Kurunczi, Sándor

Source: In Applied Surface Science 15 September 2013 281:66-72

Model dielectric function analysis of the critical point features of silicon nanocrystal films in a broad parameter range

Authors: Agocs, Emil, Nassiopoulou, Androula G., Milita, Silvia, Petrik, Peter

Source: In Thin Solid Films 31 August 2013 541:83-86

Micro-combinatorial sampling of the optical properties of hydrogenated amorphous Si1-xGex\documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$\hbox {Si}_{1-x}\, \hbox {Ge}_{{x}}$$\end{document} for the entire range of compositions towards a database for optoelectronics

Authors: Kalas, Benjamin, Zolnai, Zsolt, Sáfrán, György, Serényi, Miklós, Agocs, Emil, Lohner, Tivadar, Nemeth, Attila, Khánh, Nguyen Quoc, Fried, Miklós, Petrik, Peter

Source: Scientific reports. 10(1)

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCvdc_100183402488.0x000001&indx=1&recIds=ETOCvdc_100183402488.0x000001

Detecting nanoscale contamination in semiconductor fabrication using through-focus scanning optical microscopy

Authors: Rim, Min-Ho, Agocs, Emil, Dixson, Ronald, Kavuri, Prem, Vladár, András E., Attota, Ravi Kiran

Source: Journal of vacuum science and technology.B.Nanotechnology & microelectronics. 38(5)

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCvdc_100151797452.0x000001&indx=1&recIds=ETOCvdc_100151797452.0x000001

Optical Properties of Oxidized, Hydrogenated, and Native Zirconium Surfaces for Wavelengths from 0.3 to 25 µm − A Study by Ex Situ and In Situ Spectroscopic Ellipsometry

Authors: Petrik, Peter, Romanenko, Alekszej, Kalas, Benjamin, Péter, László, Novotny, Tamás, Perez‐Feró, Erzsébet, Fodor, Bálint, Agocs, Emil, Lohner, Tivadar, Kurunczi, Sándor, Stoica, Mihai, Gartner, Mariuca, Hózer, Zoltán

Source: Physica status solidi.A.Applications and materials science. 216(8)

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCvdc_100090612705.0x000001&indx=1&recIds=ETOCvdc_100090612705.0x000001

In Situ Characterization of Biomaterials at Solid‐Liquid Interfaces Using Ellipsometry in the UV‐Visible‐NIR Wavelength Range

Authors: Kalas, Benjamin, Agocs, Emil, Romanenko, Alekszej, Petrik, Peter

Source: Physica status solidi.A.Applications and materials science. 216(13)

Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCvdc_100085123446.0x000001&indx=1&recIds=ETOCvdc_100085123446.0x000001

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