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  1. 1
    Periodical

    Authors: KORMAN, RICHARD (AUTHOR), Barnes, Jonathan (AUTHOR)

    Source: ENR: Engineering News-Record. 3/3/2025, Vol. 294 Issue 4, p38-42. 5p. 4 Color Photographs.

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    Academic Journal

    Authors: Lee, Chih-Hung1, t104369003@ntut.edu.tw, Lin, Ding-Bing2, dblin@mail.ntust.edu.tw

    Source: Applied Sciences (2076-3417); Nov2023, Vol. 13 Issue 21, p11792, 14p

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    Conference

    Source: 2024 4th International Conference on Innovative Research in Applied Science, Engineering and Technology (IRASET) Innovative Research in Applied Science, Engineering and Technology (IRASET), 2024 4th International Conference on. :1-5 May, 2024

    Relation: 2024 4th International Conference on Innovative Research in Applied Science, Engineering and Technology (IRASET)

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    Conference

    Source: 2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD) Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD), 2024 IEEE. :1-1 Oct, 2024

    Relation: 2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD)

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    Academic Journal

    Authors: Inn, Kenneth G. W.1,2 (AUTHOR) kgenwahinn@gmail.com, McCroan, Keith3 (AUTHOR), Filliben, James4 (AUTHOR)

    Source: Journal of Radioanalytical & Nuclear Chemistry. Dec2022, Vol. 331 Issue 12, p5081-5094. 14p. 4 Diagrams, 16 Charts.

    Subject Terms: *ANSI standards, *RABBITS, *MEASUREMENT

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    Academic Journal

    Authors: Gopang, Miskeen Ali1, miskeen.gopang@faculty.muet.edu.pkshakeel.shaikh@faculty.muet.edu.pk, Ali, Tauha Hussain2, tauha.hussain@faculty.muet.edu.pk, Shaikh, Shakeel Ahmed1

    Source: Safety; Jun2024, Vol. 10 Issue 2, p52, 17p

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    Periodical
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    Academic Journal
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    Academic Journal
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    Academic Journal

    Authors: Cardinal, P.G.

    Source: IEEE Industry Applications Magazine IEEE Ind. Appl. Mag. Industry Applications Magazine, IEEE. 28(4):38-47 Aug, 2022

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